Publication

Potential roughness near lithographically fabricated atom chips
Physical Review A 76, (2007)
Potential roughness has been reported to severely impair experiments in magnetic microtraps. We show that these obstacles can be …
P. Krüger, L. Andersson, S. Wildermuth, S. Hofferberth, E. Haller, S. Aigner, S. Groth, I. Bar-Joseph, J. Schmiedmayer
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Relevance of sub-surface chip layers for the lifetime of magnetically trapped atoms
European Physical Journal D: Atomic, Molecular, Optical and Plasma Physics 35, 97–104 (2005)
We investigate the lifetime of magnetically trapped atoms above a planar, layered atom chip structure. Numerical calculations of the …
B. Zhang, C. Henkel, E. Haller, S. Wildermuth, S. Hofferberth, P. Krüger, J. Schmiedmayer
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Ultracold atoms on atom chips: Manipulation at the um distance scale
AIP Conference Proceedings, ATOMIC PHYSICS 19 770, 144–153 (2005)
Miniaturized potentials near the surface of atom chips can be used as flexible and versatile tools for the manipulation of ultracold …
P. Krüger, S. Hofferberth, E. Haller, S. Wildermuth, L. M. Andersson, D. G. Garcia, S. Aigner, S. Groth, I. Bar-Joseph, J. Schmiedmayer
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Bose-Einstein condensates: microscopic magnetic-field imaging
Nature 435, 440 (2005)
Today’s magnetic-field sensors are not capable of making measurements with both high spatial resolution and good field …
S. Wildermuth, S. Hofferberth, I. Lesanovsky, E. Haller, L. M. Andersson, S. Groth, I. Bar-Joseph, P. Krüger, J. Schmiedmayer
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